NT-MDT low-current adjustment unit

The device designed is used with Solver P47 multifunction scanning probe microscope produced by NT-MDT.

It enables to measure ultra-low currents (30 fA to 100 pA) and research high resistance materials—dielectric semiconductor layers, piezoelectric layers, conductive polymers, etc.—that could not be subject of SRI (spreading resistance imaging) research before this technology arrived.