• Industrial design
  • NT-MDT
  • NT-MDT low-current adjustment unit

    The device designed is used with Solver P47 multifunction scanning probe microscope produced by NT-MDT.



    It enables to measure ultra-low currents (30 fA to 100 pA) and research high resistance materials—dielectric semiconductor layers, piezoelectric layers, conductive polymers, etc.—that could not be subject of SRI (spreading resistance imaging) research before this technology arrived.

    Release date: June 03 2005

    Cast:

    art director
    Artemy Lebedev
    designer
    Timur Burbaev
    engineer
    Yury Trishin
    modeler
    Aleksey Zalata
    visualizer
    Igor Shmelev
    manager
    Ekaterina Berezy


    © 1995–2019 Art. Lebedev Studio



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